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May 10, 2012 | Atlanta, GA
Abhilash Goyal won a Best Paper Award at the 2012 IEEE International Symposium on Quality Electronic Design (ISQED), which was held March 19-21 in Santa Clara, Calif. A 2011 Ph.D. graduate of the School of Electrical and Computer Engineering at Georgia Tech, Mr. Goyal shares this award with his coauthors Madhavan Swaminathan (his Ph.D. advisor), Abhijit Chatterjee, John Cressler, and Duane Howard, who is Dr. Cressler’s current Ph.D. student. This work was the result of Mr. Goyal's Ph.D. thesis; he now works with SUN Oracle Research Labs.
Their paper, entitled "A Self-Testable SiGe LNA and Built-in-Self-Test Methodology for Multiple Performance Specifications of RF Amplifiers," presents a new approach for testing RF low-noise amplifier (LNA) circuits by using no external stimulus. Using this new method provides the capability for testing multiple circuit parameters and takes advantage of existing resources in typical RF receiver circuits. The paper combines both simulation and experimental results to prove that such an approach is indeed possible and provides a path towards the implementation of self-healing RF systems.